Applications Index to PI 2001 Catalog

Applications Index to PI 2001 Catalog

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For Applications Overview see p. A-11 –– A-21, for product overviews see
Selection Guides p. 1-6, 2-8, 3-5, 6-6, 6-7, 7-5, 7-6, 8-7 and 9-4.

Acceleration sensors 1-34

Active secondary mirrors A-19, 3-1 –– 3-4, 7-16

Adaptive mechanics 1-16, 1-20, 1-24 –– 1-30

Adaptive optics A-19, 3-1 –– 3-4, 3-12, 3-14, 8-8

Aerospace A-17

Alignment

~optics 3-4, 7-16, 8-8

~arrayed components A-10, A-14, 8-4, 8-8

~collimator 8-8

~directed-energy sources 7-16

~electron gun 7-16

~fiber A-11, 8-2 –– 8-26, 1-10, 1-11, 1-13, 1-15, 2-24, 2-38, 7-30, 7-66 –– 7-71

~electro-physiology A-16, 2-24

~laser A-20, 7-16

~MEMS positioning A-7, A-10

~microwave antenna test beds 7-16

~wafer steppers A-15, A-20, 2-18

Assembly A-18

Astronomy A-19, 3-2, 3-3

Autofocus systems 2-10, 2-12

Beam deflection 8-6, 1-34

Beam switching 3-9, 3-10, 3-12, 3-14, 8-6

Bending material 1-26 –– 1-30

Biology / Biotechnology A-12, A-16

Biomedical applications A-12, A-16

Collimator alignment A-10, A-11, 8-8

Compressing material 1-26, 1-28, 1-30

Confocal microscopy A-12, 2-10, 2-12, 2-38

Correction of polygon scanner errors 3-9

Data storage A-13

Defense Technology A-17

Diamond turning A-20

Directed-energy source alignment 7-16

Disk drive test A-13

Electron gun alignment 7-16

Electro-physiology A-16, 2-24

Fiber Bragg gratings A-11, 8-6, 2-20, 2-22

Fiber optics A-10, 8-1ff.

Fiber stretching A-11, 1-35

Flat panel (LCD) A-14, A-20

Flexible automation 7-72, 9-7, 9-10, 9-17

Force generation 1-20, 1-26, 1-28, 1-30, 4-25

Heavy load positioning 1-28, 1-30

Head/media test (disk drive test) A-13

High-resolution telescopes A-19, 3-1 –– 3-4, 7-16

Image resolution enhancement A-17, 3-1 –– 3-4, 2-26

Image stabilization A-17, 3-10, 3-12, 3-14

Ink-jet printers 1-35

Integrated optics 1-6, 2-8, 3-5

Interferometry A-20, 3-10

Laser

~alignment A-20, 7-16

~beam stabilization A-17, 3-10, 3-12, 3-14

~beam steering & scanning A-17, 3-9, 3-12, 3-14

~cutting A-21

~systems A-20, 2-32

~tuning 1-6, 2-8, 3-5

Lens testing A-20, 7-18, 7-19

Lithography A-14, A-15, 2-32

Life sciences A-12, A-16, 2-36

Mask and wafer alignment A-14, A-15, 2-8

Medical technology A-16

MEMS positioning/alignment 8-6, 8-8

Metrology A-20, 1-6, 2-8, 7-5, 7-6, 8-7

Micro-ablation A-21

Micro-dispensing applications 1-35, 7-18, 7-19

Micromachining A-18, 2-36, 7-16, 8-16, 8-18, 8-20

Micromanipulation A-18, 2-26, 2-28

Micromanipulation (life sciences) A-16, 2-36

Micromanufacturing A-18, 2-32, 7-18, 7-19

Microscopy A-12, 1-35, 2-10, 2-12, 7-26, 7-28

Microsurgery A-16, 7-16, 7-40, 8-8

Microwave antenna test beds 7-16

Optical device testing A-20, 7-18, 7-19

Optical inspection systems A-20

Optics

~active A-19, 3-1ff.

~astronomical A-19, 3-2, 3-3

~fiber A-10, A-11, 8-1ff.

~inspection A-14, A-20, 7-8, 7-40

~microscopy A-12, 1-6, 2-8

~wafer A-14, A-15

Out-of-roundness turning, boring, grinding A-21

Patch clamping A-16

PCB inspection A-14, A-20, 2-41

Photonics A-10, A-11, 2-22, 8-1 –– 8-26

Piezoelectric pumps 1-35

Pneumatic valves 1-32

Polygon scanner errors, correction of 3-9

Precision machining A-21, 1-5, 1-20, 1-24, 1-26, 1-28, 1-30

Quality control 1-6, 2-8,7-5, 7-6

R&D 1-6, 2-8, 7-5, 7-6, 7-16, 8-8

Scanning interferometry A-20, 2-8, 8-8

Scanning microscopy A-12, 1-35, 2-28, 2-32

Semiconductor test, inspection and manufacture A-14, A-15, 2-18

Smart structures 1-16, 1-20, 1-24, 1-26, 1-28, 1-30

Static and dynamic positioning of small parts 1-10

Static and low-level dynamic positioning of small parts 1-11

Surface structure analysis A-12, A-20, 2-8

Surgical robots A-16, 7-3, 7-4, 7-16

Switching 1-34

Telecommunications A-10, A-11

Tool control machining & manufacturing A-21, 1-5, 7-16

Track profiling 2-10, 9-8, 6-12

Ultrasonic applications 1-35

Vibration cancellation A-21, 1-16, 1-20, 1-24, 1-26, 1-28, 1-30

Wafer inspection A-14, A-15, A-20, 2-8

Wire bonding A-14, 1-32, 1-34

X-ray diffraction measurements 7-16

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Acceleration sensors	1-34
Active secondary mirrors	A-19, 3-1 –– 3-4, 7-16
Adaptive mechanics	1-16, 1-20, 1-24 –– 1-30
Adaptive optics	A-19, 3-1 –– 3-4, 3-12, 3-14, 8-8
Aerospace	A-17
Alignment
~optics	3-4, 7-16, 8-8
~arrayed components	A-10, A-14, 8-4, 8-8
~collimator	8-8
~directed-energy sources	7-16
~electron gun	7-16
~fiber	A-11, 8-2 –– 8-26, 1-10, 1-11, 1-13, 1-15, 2-24, 2-38, 7-30, 7-66 –– 7-71

~electro-physiology	A-16, 2-24
~laser	A-20, 7-16
~MEMS positioning	A-7, A-10
~microwave antenna test beds	7-16
~wafer steppers	A-15, A-20, 2-18
Assembly	A-18
Astronomy	A-19, 3-2, 3-3
Autofocus systems	2-10, 2-12
Beam deflection	8-6, 1-34
Beam switching	3-9, 3-10, 3-12, 3-14, 8-6
Bending material	1-26 –– 1-30
Biology / Biotechnology	A-12, A-16
Biomedical applications	A-12, A-16
Collimator alignment	A-10, A-11, 8-8
Compressing material	1-26, 1-28, 1-30
Confocal microscopy	A-12, 2-10, 2-12, 2-38
Correction of polygon scanner errors	3-9
Data storage	A-13
Defense Technology	A-17
Diamond turning	A-20
Directed-energy source alignment	7-16
Disk drive test	A-13
Electron gun alignment	7-16
Electro-physiology	A-16, 2-24
Fiber Bragg gratings	A-11, 8-6, 2-20, 2-22
Fiber optics	A-10, 8-1ff.
Fiber stretching	A-11, 1-35
Flat panel (LCD)	A-14, A-20
Flexible automation	7-72, 9-7, 9-10, 9-17
Force generation	1-20, 1-26, 1-28, 1-30, 4-25
Heavy load positioning	1-28, 1-30
Head/media test (disk drive test)	A-13
High-resolution telescopes	A-19, 3-1 –– 3-4, 7-16
Image resolution enhancement	A-17, 3-1 –– 3-4, 2-26
Image stabilization	A-17, 3-10, 3-12, 3-14
Ink-jet printers	1-35
Integrated optics	1-6, 2-8, 3-5
Interferometry	A-20, 3-10
Laser
~alignment	A-20, 7-16
~beam stabilization	A-17, 3-10, 3-12, 3-14
~beam steering & scanning	A-17, 3-9, 3-12, 3-14
~cutting	A-21
~systems	A-20, 2-32
~tuning	1-6, 2-8, 3-5
Lens testing	A-20, 7-18, 7-19
Lithography	A-14, A-15, 2-32
Life sciences	A-12, A-16, 2-36
Mask and wafer alignment	A-14, A-15, 2-8
Medical technology	A-16
MEMS positioning/alignment	8-6, 8-8
Metrology	A-20, 1-6, 2-8, 7-5, 7-6, 8-7
Micro-ablation	A-21
Micro-dispensing applications	1-35, 7-18, 7-19
Micromachining	A-18, 2-36, 7-16, 8-16, 8-18, 8-20
Micromanipulation	A-18, 2-26, 2-28
Micromanipulation (life sciences)	A-16, 2-36
Micromanufacturing	A-18, 2-32, 7-18, 7-19
Microscopy	A-12, 1-35, 2-10, 2-12, 7-26, 7-28
Microsurgery	A-16, 7-16, 7-40, 8-8
Microwave antenna test beds	7-16
Optical device testing	A-20, 7-18, 7-19
Optical inspection systems	A-20
Optics
~active	A-19, 3-1ff.
~astronomical	A-19, 3-2, 3-3
~fiber	A-10, A-11, 8-1ff.
~inspection	A-14, A-20, 7-8, 7-40
~microscopy	A-12, 1-6, 2-8
~wafer	A-14, A-15
Out-of-roundness turning, boring, grinding	A-21
Patch clamping	A-16
PCB inspection	A-14, A-20, 2-41
Photonics	A-10, A-11, 2-22, 8-1 –– 8-26
Piezoelectric pumps	1-35
Pneumatic valves	1-32
Polygon scanner errors, correction of	3-9
Precision machining	A-21, 1-5, 1-20, 1-24, 1-26, 1-28, 1-30
Quality control	1-6, 2-8,7-5, 7-6
R&D	1-6, 2-8, 7-5, 7-6, 7-16, 8-8
Scanning interferometry	A-20, 2-8, 8-8
Scanning microscopy	A-12, 1-35, 2-28, 2-32
Semiconductor test, inspection and manufacture	A-14, A-15, 2-18
Smart structures	1-16, 1-20, 1-24, 1-26, 1-28, 1-30
Static and dynamic positioning of small parts	1-10
Static and low-level dynamic positioning of small parts	1-11
Surface structure analysis	A-12, A-20, 2-8
Surgical robots	A-16, 7-3, 7-4, 7-16
Switching	1-34
Telecommunications	A-10, A-11
Tool control machining & manufacturing	A-21, 1-5, 7-16
Track profiling	2-10, 9-8, 6-12
Ultrasonic applications	1-35
Vibration cancellation	A-21, 1-16, 1-20, 1-24, 1-26, 1-28, 1-30
Wafer inspection	A-14, A-15, A-20, 2-8
Wire bonding	A-14, 1-32, 1-34
X-ray diffraction measurements	7-16